本論文已被瀏覽 191 次， [ ] 31 次，[ ] [ ]
One of the fundamental limitations on all analog electronics circuits is the noisegenerated by the individual transistors. This project is a design of a system to allow laboratory measurements of the noise output by MOSFET transistors, of either N-channelor P-channel devices. The system currently extends frequency response to roughly 10 MHz with the possibility of a higher bandwidth amplifier easily extending this muchfarther. In addition, the system allows the tester to easily and accurately set the bias current flowing in the test transistor, helping to show the effects of changing thetransconductance.